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Summer special for interactive test of electronic control units

Starting at the Testing Expo 2014 in Stuttgart, GOEPEL electronics offers a complete package for interactive electronic control unit (ECU) testing in context of a limited summer campaign.

The GOEPEL electronics summer special is a composition of hardware, software and an operator terminal which is pre-configured and ready to go.

The modular communication controller smartCar allows a variety of test and diagnostic applications, which can be parameterized via the innovative and easy to use software suit myCar.

As a special bonus, the package includes a Windows Tablet which completes the bundle and allows immediate use. The GOEPEL electronics summer special supports the interfaces CAN, LIN and K-Line, together with the corresponding transport and diagnostic protocol.

The offer is limited and valid until 30 September 2014.

SmartCAR+myCAR+Tablet

MATCHMAKING PROGRAM for the Aerospace & Defense Industry

EIIT will be present in Aerospace & Defense meetings in Seville from 3 to 6 of June, where B2B platforms, high level conferences and industrial tours will help the understanding of the aerospace business trends and needs. The event will be hold at IBES PALACIO DE CONGRESOS Y EXPOSICIONES DE SEVILLA (Avenida ALCALDE LUIS URUÑUELA, 1, Sevilla).
More information under: http://www.bciaerospace.com/sevilla/en/

Please contact us if you require a personal meeting.

ADM Sevilla

NIDays 2014 – 2nd Prize for the Best Application of Test and Measurement

During the technical sessions organized last April 8, 2014 by the company National Instruments in the IFEMA fairgrounds , our engineer Miguel Navas , from our Special TEST Equipment Business Unit, made ​​a technical presentation of a project recently delivered. The project was awarded with the second prize for the best application of test and measurement during the past year.

We are proud of this recognition that encourage us to continue working on applications that that require deep knowledge and control of the hardware and software tools from National Instruments, as well as other technologies used in them.
EIIT, as an expert in the design and manufacture of test equipment and National Instruments Alliance Member was represented at a booth in the exhibit area where attendees could see real test applications.

NI Days 2014

NI DAYS 2014 SPAIN

EIIT, a National Instruments Alliance Member, will be present once again at the NI Days Technology Forum showing innovative test solutions in our core business areas.

The event will take place on April 8 at the IFEMA Trade Fair (North Convention Center). You will find us in the exhibitor’s area.
Registration must be done entering in http://spain.ni.com/nidays

 

NI DAYS 2014 Spain
NI DAYS 2014 Spain

International distributors

EIIT in its ongoing process of internationalization is pleased to announce the newly opened global network of distributors. We hope in this way to reach more customer locations and offer the best service.

These partners will strengthen the company’s access to their countries and will provide direct, quick and effectively support to the end customers.

We welcome our partners:

  • ELAS Kft (Hungary)
  • Ol-Tech (Poland)
  • Lenax (England)
  • Lenax (Bulgaria)
  • Edgetech  (India)
  • Puva (Mexico)
  • Maxtronix (Philippines)

For detailed contact information, check at our website under WHERE WE ARE, EIIT PARTNERS

Distribution agreement with TRI

GRUPO EIIT announces the distribution agreement in Spain and Portugal of the testing products of the Taiwanese company Test Research, Inc. Additionally we have signed an international agreement, that allows us to integrate TRI’s ICT/MDA instrumentation into our Offline and In-Line Test Handlers. At GRUPO EIIT, we do believe that this strategic partnership will make us grow internationally delivering fully integrated TRI’s & EIIT outstanding products, but also comprehensive services.

About TRI

TRI provides the most effective cost/performance solutions to meet a comprehensive range of manufacturing Test and Inspection requirements. From Solder Paste Inspection (SPI), Automated Optical Inspection (AOI), and 3D Automated X-ray Inspection (AXI) systems to Manufacturing Defect Analyzers (MDAs) and In-Circuit Test equipment.
Test Research, Inc. was founded in April 1989, is dedicated to playing a leading role as a solutions provider in inspection & testing automation for the electronics, information and communication industries. With strong R&D capabilities, they have developed automated inspection & testing equipment used for PCB assembly and IC packaging. These products have served to improve their customers’ productivity, yields and product quality. Presently, TRI has 800 employees and has established offices in the USA, Malaysia, Mainland China, Germany, Japan and Korea. They also have distributors in over 30 countries. Learn more at www.tri.com.tw.

GOEPEL electronic demonstrates JTAG controllable Mixed Signal Tester-on-Chip (ToC)

At the 2013 International Test Conference, GOEPEL electronics will be demonstrating CION™ LX, the world’s first JTAG controllable Tester-on-Chip (ToC) with mixed signal architecture. The newly developed chip provides single-ended and differential test channels, which feature a Boundary Scan interface compliant with IEEE Std. 1149.1, IEEE Std.1149.6, or IEEE Std 1149.8.1. All channels can be coupled with numerous integrated analogue and digital instruments. As a result, the CION™ LX can support more than 15 different static and dynamic test and measurement operations on each test channel. In addition to classic Boundary Scan functionalities, these are arbitrary waveform generation, analogue signal recording, digital frequency measurement and toggle detection. In connection with programmable interface characteristics such as slew rate or pull up/down, the CION LX offers extremely flexible signal configuration and, therefore, necessary universality as a tester interface.

“The new CION LX helps to create universal scalable low-cost test systems that can easily be integrated into existing JTAG ecosystems, covering analogue and digital test and measurement tasks”, says  Heiko Ehrenberg, Technology Officer for Embedded System Access (ESA) with GOEPEL electronics Ltd. USA. “The application focus is placed upon test quality improvement through deeper and more flexible structural tests and at-speed tests that don’t require high performant instrumentations. The utilized per pin architecture enables nearly unlimited implementations of mixed signal test strategies.”

About the CION™ LX:

CION LX

The CION LX was developed in 0.35 µm mixed-signal CMOS technology and provides four independent I/O ports. Each port can be individually operated in a voltage range from 0.9 V to 3.6 V. The integrated Boundary Scan architecture supports the standards IEEE 1149.1, IEEE 1149.6 and IEEE 1149.8.1, at a maximum TCK frequency of 100 MHz. In addition to the single-ended pins, the CION LX provides differential signals as well as interfaces with increased driver ability. Four operation modes enable the IC‘s flexible utilization as purely serially controlled JTAG transceiver, parallel I/O buffer, latched bus transceiver, and pin driver.

Furthermore, instruments such as digitizer, arbitrary waveform generator, event counter, frequency meter and toggle detector are integrated into the CION LX. These instruments can be accessed – depending on operation mode – either serially via the JTAG Test Access Port (TAP) or a parallel control bus. The instruments can be activated simultaneously to Boundary Scan operations and per test channel. For each channel, pull-up and pull-down resistors can be additionally connected. Moreover, the drivers’ slew rates are programmable.

Availability and Licensing:

The CION LX is currently available as a sample. First series deliveries are planned for quarter three in 2013. An LGA housing with 116 pins will be used. Additionally, there will be a CION LX Evaluation Board.

About JTAG/Boundary Scan:

Boundary Scan (IEEE Std. 1149.x) is a modern access method for the test and programming of complex circuits without mechanical probe access (non-intrusive).

Boundary Scan is part of the Embedded System Access (ESA) strategies and is based on design-integrated test electronics. ESA technologies include techniques such as Chip Embedded Instruments, Processor Emulation Test, In-System Programming or Core Assisted Programming. They are currently the most modern strategies for validation, test and debug as well as programming of complex boards and systems. They can be applied throughout the entire product life cycle, enabling enhanced test coverage at reduced costs.

GOEPEL electronic automates Validation and Test of High-Speed I/O by FPGA Embedded Instruments

At the 2013 International Test Conference, GOEPEL electronic introduced an Automatic Application Program Generators (AAPG) for design validation and test of FPGA integrated high-speed I/O (HSIO) based on the ChipVORX® technology for FPGA Embedded Instruments. Users can now evaluate transmission channel quality by utilizing Bit Error Rate Tests (BERT). This provides a graphical evaluation per dynamic eye diagram to support design validation.

“The development towards FPGA based board designs is also accompanied by more and more high-speed I/O, difficult to test by traditional metrology due to continuously decreasing physical access. Our new solution addresses this very problem”, says Heiko Ehrenberg, Technology Officer for Embedded System Access for GOEPEL electronics in the USA. “Because of high automation level, the high-speed I/O’s FPGA parameters can be interactively defined, and become immediately effective without design synthesis, i.e. users can directly validate the influence on transfer quality. Furthermore, signals received in the silicon are recorded and visualized, which enables unaltered measurement results.”

About the Automatic Application Program Generator:
The new generator is another option in the integrated JTAG/Boundary Scan software platform SYSTEM CASCON™, enabling automatic generation of complete application scripts for FPGA embedded HSIO test instruments. These are chip-dependent instrument selections, establishment within an FPGA, addressing, configuration, procedural control, qualification of generated data and graphical eye visualization.
The AAPG connects ChipVORX model integrated instrument information with the intrasystem data base for structural and functional UUT (unit under test) description and protocol-specific user guidelines for configuration of the target FPGA’s high-speed I/O channels. The fully automatically generated script is based on the SYSTEM CADCON™ integrated standard language CASLAN (CAScon LANguage) and can be executed on each run-time station without additional options. Gang applications are also supported.

About Bit Error Rate Test (BERT):
So called Bit Error Rates (BER) are measured to evaluate the channel quality in digital transmission systems. BER is the relation between faulty transported bits and the total number of transported bits in a certain time interval. The equipment consists basically of the pattern generator, a transceiver with error detector and a clock generator, synchronising both. The bit patterns, created by the pattern generator, are in particular important for the quality of the Bit Error Rate Test, as they have critical influence on the fault stimulation during the transmission (stress pattern).

About Chip Embedded Instruments:
Chip embedded Instruments are permanently integrated or temporarily implemented test and measurement functions (T&M) in an integrated circuit. Virtually, they are the counterpart to external T&M instruments as they don’t require invasive contacting by means of probes or nails. Hence, the problem of signal distortion in high-speed designs by parasitic contacting effects is omitted. Chip embedded Instruments are part of the so called Embedded System Access (ESA) technologies that are currently the most modern strategy for validation, test and debug as well as programming of complex boards and systems. They can be utilised throughout the entire product life cycle, enabling improved test coverage at reduced costs.

About ChipVORX®:
ChipVORX is an IP-based technology for implementation, access and control of Chip embedded Instruments via IEEE Std. 1149.x/JTAG. It also supports FPGA embedded instruments in the form of softcores. The ChipVORX library currently contains more than 300 different test and measurement instruments for all leading FPGA platforms. Some of these instruments are frequency meters and high-speed Flash programmers as well as IP for at-speed access test of dynamic RAM devices.

About the development, funding and availability:
The BERT instruments development as prototypes and their integration into respective system software is the result of a strategic cooperation between GOEPEL electronic and Testonica Lab. The ChipVORX® IP models for BERT will be supported in SYSTEM CASCON™ starting from version 4.6.3 , and are activated per license manager just like the system software. SYSTEM CASCON™ is GOEPEL electronic’s professional JTAG/Boundary Scan development environment with currently more than 45 fully integrated ISP, test and debug tools. In terms of hardware, ChipVORX is completely supported in the platform SCANFLEX®.

The project upon which this publication is based was funded by the Federal Minister of Education and Research within the frame of the Eurostars funding programme (E! 5568 COMBOARD).

GOEPEL electronic and iSYSTEM develop integrated Platform for Software and Hardware Validation and Test

At the 2013 International Test Conference, GOEPEL electronic, world-class Boundary Scan vendor and iSYSTEM, innovative tool provider for embedded software design announce the market introduction of another new development within the framework of a long-term strategic cooperation for Embedded System Access (ESA) technologies.
The innovation named iTIC seamlessly integrates a complete on-chip debugger in the form of a TAP Interface Card (TIC) into the ESA hardware platform SCANFLEX® for the first time. On this basis, it brings together technologies for non-intrusive software and hardware validation and test with unprecedented compatibility.
The iTIC, controlled via the TAP Interface Cards’ internal standard interface, supports all procedures for software debugging as well as any technologies for Embedded System Access, such as Boundary Scan, Processor Emulation Test, FPGA Assisted Test and in-system programming of Flash and PLD.

“The new iTIC is a highly important milestone for the holistic implementation of our Embedded System Access philosophy. The successful cooperation with our long-term, partner iSYSTEM enables us to support a considerably higher number of microprocessors and, furthermore, exploit synergies between different applications to an even greater degree”, says Thomas Wenzel, Managing Director of GOEPEL electronic’s JTAG/Boundary Scan Division. “The opportunity to execute all procedures on one platform brings users added efficiency in design validation and flexibility in test throughout the entire product life cycle.”

“In recent years, we systematically extended our tools‘ connectivity for embedded software development and test and associated partnerships with vendors of complementary products to create significant added values in operational efficiency and performance for our customers“, explains Erol Simsek, CEO with iSYSTEM AG. “Based on the intensive cooperation with GOEPEL electronic as market leader for Embedded System Access technologies, we will continue this course, and, additionally, extend our activities as OEM vendor.”

iTIC

About the iTIC module:
The iTIC is already the seventh member in the TAP Interface Card (TIC) family, controlled via a differential interface. That means, all existing installations can be simply upgraded.
The differential coupling enables trouble-free data transfer up to 80 MHz over distances of up to four meters. There will be no performance loss because runtime delays of cables and units under test (UUT) can be individually compensated per TAP by means of the ADYCS™ technology. As a result, the iTIC can be integrated into application critical environments such as In-Circuit test fixtures.
Designed as an active test head, the iTIC supports a multitude of different operations and process architectures. These include standards such as IEEE1149.1, IEEE1149.6, IEEE1149.7, IEEE1532 and IEEE-ISTO 5001, and numerous non-JTAG interfaces like BDM (Background Debug Mode), SBW (Spy-Bi-Wire), SWD (Serial Wire Debug) and many more. The target interface can be completely galvanically isolated via relays.

The iTIC is supported in the leading JTAG/Boundary Scan software SYSTEM CASCON™ and automatically detected by the AutoDetect feature. Through OEM cooperation with all leading vendors of In-Circuit testers (ICT), Manufacturing Defect Analysers (MDA), Flying Probers (FPT) and Functional Test systems (FCT), the new solution is available immediately for production test applications.

About Embedded System Access (ESA):
ESA technologies enable the electrical access to embedded systems without utilizing mechanical nails or probe contacts (non-invasive methods). They apply design-integrated test and debug interfaces such as JTAG. In addition to Boundary Scan, ESA technologies include procedures like Chip Embedded Instruments, Processor Emulation Test, In-system Programming or Core Assisted Programming. ESA technologies are currently the most modern strategies for validation, test and debug as well as programming complex chips, boards, and complete units. They can be utilized throughout the entire product life cycle, enabling increased test coverage at reduced costs.

About GOEPEL electronic:
GOEPEL electronic is a worldwide leading vendor of innovative electronic and optical test and inspection systems, being the market leader for professional JTAG/Boundary Scan solutions for Embedded System Access (ESA). A network of branch offices, distributors and service partners ensures the global availability of the products as well as the support of the more than 8,000 system installations. Founded in 1991 and headquartered in Jena/Germany, GOEPEL electronic employs currently more than 200 employees and generated a revenue of 27 Million Euro in 2012 (ca. $36 Mio). GOEPEL electronic has continuously been ISO9001 certified since 1996 and has been honoured with TOP-JOB and TOP-100 awards for being one of the best medium-sized companies in Germany. GOEPEL electronic’s products won several awards in recent years and are used by the leading companies in telecommunication, automotive, space and avionics, industrial controls, medical technology, and other industries. Further information about the company and its products can be found on the internet at www.goepel.com.

About iSYSTEM:
iSYSTEM is a privately held company headquartered in Germany, close to Munich. Since its foundation in 1986, iSYSTEM is an independent manufacturer and provider of embedded software debugging and test tools. Beside standard products iSYSTEM offers development and production services for custom designs, projects and OEM products.

iSYSTEM’s Blue Box Technology stands for fast and easy microcontroller access via any kind of microcontroller debug interface. No matter whether one is developing, debugging or testing embedded software on a real target system. iSYSTEM’s open and integrated Debug and Test Software enables engineers to drive a Blue Box and the corresponding development.

iSYSTEM tools mainly do support safety and security application development. Thus, control software development in markets such as Automotive/Transportation, Railway, Avionics, and Medical where customers require high sophisticated functionality, test automation support, services and certification. Markets like Industrial, Telecom, and Consumer do benefit from this software configurable tool portfolio by adopting it easily to their actual needs.

iSYSTEM specializes in embedded development and test tools, provides debugger and analyzer solutions for more than 50 CPU architectures and their derivatives (3000+ microcontrollers). The Windows and/or Eclipse based development environment is easy to learn and use. The flexible integration and application of iSYSTEM solutions within the entire development process is enabled by open and public interfaces (APIs).

iSYSTEM maintains long standing and close relationships with all major semiconductor, operating system and compiler companies worldwide. This guarantees quick tool availability and the highest level of integration.

iSYSTEM is a ISO9001:2008 certified company.

Productronica 2013

From 12 to 15 November, EIIT will have a 50m2 stand at the most important fair in the electronics production equipment sector, Productronica, in Munich. This is the twentieth edition of this event, which has been organised biannually for several years now, and which in 2011 received 13,325 attendees, who had the opportunity of visiting a total of 214 exhibitors in 7 different halls.

Our 4 business units will be there, although we will pay special attention to Special Test Equipment and Solutions, Equipment & Partnership. We will present our fourth generation of in-line test systems, with surprising new features. We will also have screening test equipment and one or two other surprises!

Our stand will be located in the A1 test pavilion, in stand 434. To access it, you need to use the west entrance of the Munich Fair.

Visiting times are:

  • Tuesdays to Thursdays: 09:00h – 18:00h
  • Fridays: 09:00h – 16:00h

Here is a link of the organisation with directions to the exhibition site:

http://productronica.com/en/home/visitors/sn/getting_there/~/sourceId/20849622

If you would like to receive electronic invitations for the event, send an email with your contact details to eiitsa@eiit.com indicating in the email heading, PRODUCTRONICA 2013.